V.T62 — Master exhaustion inequality

Master exhaustion inequality: for initial defect count |D_0| = N: (i) |D_n| <= (1 - iota_tau)^n N, (ii) S_def(n) <= (1 - iota_tau)^n S_def(0), (iii) n_coh <= ceil(ln N / ln(1/(1 - iota_tau))). Consolidates all defect exhaustion results into a single three-part bound.